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PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Reliability and 
 Microintegration IZM//EN
BEGIN:VEVENT
UID:25a2cdb3-6029-45b5-a6be-7e9bd686a3d6
DTSTAMP:20260826T141847Z
SUMMARY:ECTC – 2027 IEEE 77th Electronic Components and Technology Conferen
 ce
DTSTART:20270601T070000Z
DTEND:20270604T160000Z
END:VEVENT
END:VCALENDAR