BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Reliability and 
 Microintegration IZM//ENGLISCH
BEGIN:VEVENT
UID:4b5e5df5-738f-47c6-8b69-6eb89e6ff526
DTSTAMP:20260903T043225Z
SUMMARY:»Hide and Seek: Electronic waste in the in vitro diagnostics (IVD) 
 industry«
DTSTART:20250429T130000Z
DTEND:20250429T140000Z
END:VEVENT
END:VCALENDAR