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VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Reliability and 
 Microintegration IZM//ENGLISH
BEGIN:VEVENT
UID:e518c1cf-a242-4a8f-ab1a-d75355e66031
DTSTAMP:20261015T130249Z
SUMMARY:Next-Generation Neural Implants: Pathways to Longevity
DTSTART:20250415T140000Z
DTEND:20250415T144500Z
END:VEVENT
END:VCALENDAR