BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Reliability and 
 Microintegration IZM//ENGLISH
BEGIN:VEVENT
UID:8e020362-1f70-41b6-b4ec-bb3ac83e6d99
DTSTAMP:20260903T044035Z
SUMMARY:EXPERT SESSION SERIES »Powering the Future - Innovative Technologie
 s for Power Electronics Modules with SiC and GaN Semiconductors«
DTSTART:20240130T150000Z
DTEND:20240326T150000Z
END:VEVENT
END:VCALENDAR