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VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Reliability and 
 Microintegration IZM//EN
BEGIN:VEVENT
UID:1ff5d549-b56e-4d55-974b-6449c1eef6ed
DTSTAMP:20260508T010405Z
SUMMARY:FIRST by FMD – Fast Innovation through Research in Semiconductor Te
 chnologies
DTSTART:20260930T070000Z
DTEND:20261001T140000Z
END:VEVENT
END:VCALENDAR