BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Reliability and 
 Microintegration IZM//ENGLISCH
BEGIN:VEVENT
UID:5e118acc-5abc-4103-82ef-7f278923cf45
DTSTAMP:20260508T033655Z
SUMMARY:»Hide and Seek: Electronic waste in the in vitro diagnostics (IVD) 
 industry«
DTSTART:20250429T130000Z
DTEND:20250429T140000Z
END:VEVENT
END:VCALENDAR