BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Reliability and 
 Microintegration IZM//ENGLISH
BEGIN:VEVENT
UID:90c7c587-6db6-46f3-9521-b8bbbf6346e1
DTSTAMP:20251209T205503Z
SUMMARY:Highly reliable Interconnect Processes for Power Electronics
DTSTART:20240227T150000Z
DTEND:20240227T154500Z
END:VEVENT
END:VCALENDAR