BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Reliability and 
 Microintegration IZM//ENGLISH
BEGIN:VEVENT
UID:d0a05b2a-7729-47e9-9d21-a37400a9eb53
DTSTAMP:20251211T034340Z
SUMMARY:Novel Integration Concepts for Power Electronics – PCB Embedding fo
 r SiC and GaN Semiconductors
DTSTART:20240312T150000Z
DTEND:20240312T154500Z
END:VEVENT
END:VCALENDAR