High-Frequency Technology - Equipment and Tools - Advanced System Engineering Lab - Fraunhofer IZM - R3S
© Fraunhofer IZM

Advanced System Engineering Lab

High-Frequency Technology - Equipment and Tools

The HF lab specializes in measuring planar, “on-wafer” test samples at up to 110 GHz and the 3D characterization of antenna modules in shielding cabins. We can also determine the dielectric parameters of substrates nondestructively.

Laboratory equipment

  • 2-gate 110GHz network analyzer
  • 4-gate 65GHz network analyzer
  • Chuck for on-wafer probing (thermal control up to 200°C)
  • 18 GHz shielding cabin
  • Antenna measurement station for 3D far-field measurements
  • Calibrated horn antennae up to 110GHz
  • Impedance analysis
  • HF and DC measurement tips for planar test samples
  • Signal analyzers / generators
  • Split cylinder resonators for material characterization
  • Measurement station for thin film threshold voltages

Design tools

  • Ansys (in particular Icepack, HFSS, Maxwell, Q3D, SI-Wave)
  • Mathematica, Matlab
  • CST Microwave Studio
  • Cadence design environment
  • Agilent ADS
  • Measurement device control using Wincal and Labview
 

Download

Flyer