Key Research Areas

Reliability: simulation, test and optimization

© Fraunhofer IZM

Reliability: simulation, test and optimization cover the development and application of experiments and simulations which make it possible to "Design for Reliability". The basis is provided by life-time models determined in accelerated tests.
The combination of simulation and experiments can be used to derive design rules. As a consequence, the reliability of new products can be increased, and therefore, new fields of applications in microsystem technology can then be available.

The following approaches are adopted, further developed and combined:

  • Multi-physics simulation of fault mechanisms and optimisation at the component and system levels
  • Combined and accelerated tests (temperature, moisture and vibration)
  • Testability and online-monitoring with accelerated ageing
  • Ageing and failure analyses, sample preparation and analysis

Typical mechanisms to be investigated are:

  • Thermomechanical fatigue (e.g. soldered connections, through vias)
  • Mechanical overloading
  • Crack formation and delamination
  • Electro-migration
  • Moisture diffusion

Achieving solutions requires close cooperation with other groups in IZM and project partners. This will also allow better coordination in order to reach other development goals (e.g. technological feasibility, costs, EMC, thermal management, energy consumption, or environmental impact).

Key research areas relating to Reliability Assessment, Testing and Optimization

 

Thermal Management

In addition to thermal mechanics, the thermal management is important for the reliability of electronics. We offer a range of methods for simulation and characterisation, especially for thin thermal interface materials and for cooling strategies.

Projects relating to Reliability Assessment, Testing and Optimization

 

AMWind

Condition Monitoring for Wind Turbines

In this project, a junior research group is developing techniques for the fast and accurate reliability prediction of material composites at the intersection between micro- and nano-range.
 

TeSiMat

Analysis and Testing System for the Reliability Assurance of Micro- and Nanoelectronic Material Composites

In this project, a junior research group is developing techniques for the fast and accurate reliability prediction of material composites at the intersection between micro- and nano-range.
 

Flyer

Robustness and life cycle assessment

 

Flyer

Topographic
Measurements

 

Flyer

Stress-measurement for microsystems

 

Projects of the Department of Environmental and Reliability Engineering