Nürnberg Messe / June 09, 2026 - June 11, 2026
Fraunhofer IZM at the Measurement Fair SENSOR+TEST
Hall 1, Booth 1-317
Hall 1, Booth 1-317
Discover the newest tech from Fraunhofer IZM at SENSOR+TEST 2026: Energy-efficient solutions for highly miniaturized sensor systems (green ICT), innovative hardware concepts, and radar sensors. The show will include recent research and innovations in advanced packaging, smart system integration, and panel to wafer-level thin glass photonics.
Meet our experts from the RF & Smart Sensor Systems, Wafer Level System Integration, and Optical Interconnect Technology departments and exchange experiences.
Fraunhofer IZM is bringing news and insights in several areas to SENSOR+TEST 2026:
Fraunhofer IZM is a global leader in wafer-level system integration, with groundbreaking technologies like vertical vias for silicon and glass wafers, high-density multi-layer wiring systems using thin film technology, wafer-level housing and encapsulation concepts, and novel ways to connect ICs and substrates with the thinnest of metallic contacts.
Hybrid pixel detector modules are the state of the art for synchrotron and X-ray imaging experiments. With its compact X-ray detector in a USB stick form factor, the »Wafer Level System Integration« department is showcasing its expertise in packaging and interconnection technologies for highly integrated pixel detector systems.
On show:
The IZM specialists for »Optical Interconnection Technology« are working on solutions for integrating photonics and electronics, with 2D connectivity for electro-optical printed circuit boards and 3D connectivity by photonic system assembly.
Thin glass technologies make it possible to create laser-structured, hermetically sealed optical interfaces in stacked packages - scalable in panel and wafer processes.
At Sensor+Test 2026, the group will showcase photonic wire bonding, micro-optical printing, among other things.
On show:
Exhibits on show: