Working Groups

Technologies for Bioelectronics

Tiny implants with a compact 3D layout, with all components that give the system its intelligence integrated on the device
© Fraunhofer IZM
Tiny implants with a compact 3D layout, with all components that give the system its intelligence integrated on the device

We design and fabricate active neural interfaces. We integrate small custom-designed electronics into microsystems for stimulation of and recording from the neural tissue. Our microsystems are often flexible implants based on biocompatible materials tailored for the central or peripheral nervous system. We design, fabricate, package and test our implants for long-term use. We also investigate new approaches for neural stimulation and wireless power transfer.

  • flexible electrode fabrication for neural stimulation and recording
  • protection of active implantable devices based on soft materials
  • ultrasound wireless power transfer for deep implants
     

Technologies for Soft, Flexible Neural Interfaces

image -  Working Groups Technologies for Bioelectronics
© Fraunhofer IZM
  • 200 mm wafer process compatibility
  • Biocompatible metallisation via cost-effective semi additive manufacturing
  • Near-hermetic conformal encapsulation using one-step Parylene C – ALD ceramic deposition
  • Self-bonding thermoplastic polyurethane encapsulation for reduced delamination
  • Laser Direct Imaging for rapid prototyping

Implantable Neural Devices Technology

image -  Working Groups Technologies for Bioelectronics
© Fraunhofer IZM
  • Pliable microelectrode arrays for peripheral nerve stimulation
  • Flexible brain implant technology with high density interconnects
  • Versatile electrical neural stimulation with multiple channels

Testing and Characterization of Neural Implantable Devices

image -  Working Groups Technologies for Bioelectronics
© Fraunhofer IZM

Encapsulation Reliability Test Setup

  • Automated in situ tests of encapsulated small implants
  • Large-scale and long-term accelerated soak tests
  • Lifetime estimation and failure mode investigations

AutomatedUltrasound Field Measurements

  • Frequency range from 100 kHz to 120 MHz
  • Resolution down to 75 μm
  • Lower dynamic range limit down to 40 Pa

Team and contact

Dr. Joshua Wilson
Dr. Joshua Wilson

Dr. Joshua Wilson

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-709

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Anna Pak
Anna Pak

Anna Pak

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-700

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Andrada Iulia Velea
Andrada Iulia Velea

Andrada Iulia Velea

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-709

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Konstantina Kolovou-Kouri
Konstantina Kolovou-Kouri

Konstantina Kolovou-Kouri

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-700

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Lukas Holzapfel
Lukas Holzapfel - Fraunhofer IZM

Lukas Holzapfel

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-700

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Raphael Panskus
Raphael Panskus - working groups - Technologies for Bioelectronics / Fraunhofer Institute for Reliability and Microintegration IZM

Raphael Panskus

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-709

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Stefan Tornedde

Stefan Tornedde

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-709

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Este Ainun Najib
Este Ainun Najib

Este Ainun Najib

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-709

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Jana Marie Späth
Jana Marie Späth

Jana Marie Späth

Fraunhofer Institute for Reliability and Microintegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-700

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Punal Surani
Punal Surani

Punal Surani

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-709

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Pablo de Anta Dardagan

Pablo de Anta Dardagan

Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Gustav-Meyer-Allee 25
13355 Berlin

Phone +49 30 46403-709

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Alumni